Modern RF and high-speed digital systems require engineers to observe and characterize signals not only at connectors, but deep inside the circuit. Probing solutions enable contact to fine-pitch pads, traces, and device pins without redesigning the PCB or adding dedicated connectors, thereby shortening development cycles and improving debug efficiency.

To be effective, RF and high-speed probes must combine controlled impedance, low intrusion, and mechanical stability.

WithWave probing solutions are designed to address these challenges. T-Probes and matching probe positioners provide stable access to on-board RF and high-speed nodes, while testing pin probes support reliable contact in sockets, fixtures, and ATE environments. Together, they help engineers build probing setups that deliver consistent, trustworthy results from early evaluation through production test.