5G • 6G Communication
Test&Measurement
Semiconductor
Data Server
Quantum Computer
Hyprobe® Solutions
High Speed Testing Probe Pin & Socket
WithWave’s “Hyprobe® Solution” offers press-probe and MEMS-probe sockets specifically designed for mass-production testing of Board-to-Board (BtoB) connector devices. The core of the Hyprobe sockets lies in their patented probe pin structure, featuring independently operating top and bottom beams. This innovative design ensures stable contact and guided beam movement, which ultimately leads to a high device pass rate and long life cycles.
Features
• Optimized probe pin structure for high-speed signal transmission
• Stable PCB and BtoB connector contact.
• Manufacturing precision injection molded parts
• Low cost and long life cycles
Specifications
| Pad Pitch [mm] | Data Rate [Gbps] | Probe Stroke [mm] | Contact Resistance [mOhms] |
Probe Reliability | Current [A] |
|---|---|---|---|---|---|
| Over 0.3 | Min. 40 | 0.3 | Max. 100 | Min. 300 K cycle | Under 2.0 |
| Under 0.175 | Min. 30 | 0.27 | Max. 200 | Min. 300 K cycle | Max. 1.0 |
Applications
• Camera modules test
• Display modules test
• Mobile sensor modules test
• PCB & FPCB pad probing test
• Semiconductor device test