Modern semiconductor devices operate at ever-higher frequencies and data rates for 5G/6G, Wi-Fi, automotive, and high-speed SerDes applications. As a result, precise RF performance and signal integrity verification are required at every level: wafer, package, board, and system. Across evaluation boards, reference designs, and ATE (Automatic Test Equipment) systems, high-quality connectors, cables, multi-coax assemblies, and probing solutions are critical.

WithWave provides RF interconnect and test solutions covering DC to mmWave and multi-tens to multi-hundreds of Gbps high-speed data channels, delivering consistent, repeatable measurement environments for semiconductor design, verification, and production test lines. WMX multi-coax, multi-channel SMPM/SMPS, T-probes and probe positioners, high-speed cable assemblies and connector solutions, and testing pin probes are all optimized for demanding semiconductor test requirements.